Electrochemical atomic force microscopy device
Buyer: Aalto University Foundation sr
- Published
- 7 September 2026
- Place of performance
- Espoo, FI1B1
- Procedure
- Negotiated procedure
- Lots
- 1
- Notice number
- 00615480-2026
- Reference
- 32e0f879-0e21-4cc7-bc34-d8899c5b2019
- Official source
- Official source
CPV codes
- 38000000Equipo de laboratorio, óptico y de precisión (excepto gafas)
Description
Electrochemical atomic force microscopy device: 1) non-resonant sinusoidal-oscillating imaging mode (nroIM): a. Pure vertical z-modulation of the cantilever; amplitudes (from < 1 nm to > 250 nm) and frequencies (from 125 Hz up to 2 kHz) freely selectable. b. In each contacting cycle, a direct determination of the maximum contact force (force setpoint) takes place in real time, where upon all control parameters are automatically and continuously optimized. Force setpoint minimum down to 10 pN. Stable imaging also for "negative force setpoints", i.e., below the baseline of the free force curve. c. Effective line rate >= 2 Hz at 512 pixel/line for all force setpoints possible. d. Suited for cantilevers with spring constants from < 0.001 N/m to > 500 N/m. e. Topography, DMT modulus, adhesion, energy dissipation, force setpoint error and deformation are measured and displayed simultaneously (location and time) and in real time. f. Lateral resolution down to atomic defects in lattice is possible. g. The tip-sample force interaction is continuously displayed in real time during the imaging process. h. This mode can be operated without any limitation of functionality with liquid c…
Award criteria
- Price — Price
Awards
| Awarded to | Amount | Date |
|---|---|---|
| BSL Vetenskaplig filial | — | — |
Official publications
- TED · 00615480-2026 · 7 September 2026
- OJS · 172/2026 · 7 September 2026
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