Scanning electron and focussed ion beam microscope (FIB-SEM)

Published

28 November 2024

Procedure

Open procedure

Lots

1

Notice number

00726424-2024

Reference

ab11cae4-5019-4cf6-91de-23f5394e2782

Official source

Official source

CPV codes

• 38511100Microscopios electrónicos de barrido

Description

Scanning electron and focussed ion beam microscope (FIB-SEM)

Award criteria

• Quality — Technischer Wert
• Cost — Lebenszykluskosten (LCC)
• Quality — Systemerweiterungen/Upgrades
• Cost — Nachhaltigkeit
• Quality — Serviceleistungen
• Cost — Lieferzeit

Awards

Official publications

• TED · 00726424-2024 · 28 November 2024
• OJS · 232/2024 · 28 November 2024

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