Metrology SEM+FIB system
Buyer: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Published
- 28 July 2026
- Submission deadline
- 7 September 2026
- Estimated value
- €1,300,000
- Procedure
- open
- Lots
- 1
- Notice number
- 00519634-2026
- Reference
- f890e1f5-5236-4ee0-8a94-cd0b658c3492
- Official source
- Official source
CPV codes
- 31712000Maquinaria, aparatos y microsistemas microelectrónicos
- 38900000Instrumentos de evaluación o ensayo diversos
Description
The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Levering van één SEM +FIB systeem
Frequently asked questions
- What is the deadline to bid for this tender?
- The submission deadline is 7 September 2026. Check the official source, as dates can be modified.
- What is the estimated value of this tender?
- The estimated value published by the buyer is €1,300,000.
- Who is the buyer of this tender?
- The contracting authority is Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO (European Union).
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