Focused Ion Beam, Scanning Electron Microscope (FIB-SEM)
Buyer: Lunds universitet
- Published
- 2 July 2026
- Submission deadline
- 24 August 2026
- Estimated value
- 28,000,000 kr
- Place of performance
- SE224
- Procedure
- open
- Lots
- 1
- Notice number
- 00456632-2026
- Reference
- 83edc331-c062-4d95-ba36-6c6d1addc85d
- Official source
- Official source
CPV codes
- 38511100Microscopios electrónicos de barrido
- 38000000Equipo de laboratorio, óptico y de precisión (excepto gafas)
Description
Lund Nano Lab (LNL) at Lund University intends to purchase a Focused Ion Beam Scanning Electron Microscope, in this document referred to as the FIB-SEM, instrument or equipment. This document lists all the requirements the FIB-SEM must meet. The instrument is intended to be used for high-resolution imaging, materials analysis and preparing samples for TEM analysis as well as for experiments at the MAX IV synchrotron.
Frequently asked questions
- What is the deadline to bid for this tender?
- The submission deadline is 24 August 2026. Check the official source, as dates can be modified.
- What is the estimated value of this tender?
- The estimated value published by the buyer is 28,000,000 kr.
- Who is the buyer of this tender?
- The contracting authority is Lunds universitet (European Union).
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