FIB / TEM Ga Focused Ion Beam Instrument and Transmission Electron Microscope
Buyer: Empa zentraler Einkauf
- Published
- 4 September 2025
- Procedure
- Open procedure
- Lots
- 1
- Notice number
- 00577097-2025
- Reference
- a58903b5-3ccb-49ec-b2a8-60a78eba9df2
- Official source
- Official source
CPV codes
- 38511000Microscopios electrónicos
Description
The two instruments shall warrant a smooth workflow for TEM sample preparation by FIB and state-of-the-art sample characterization by analytical, high-resolution TEM/STEM, particularly, but not exclusively. A broad spectrum of materials science samples shall be addressed, including highly fragile and beam-sensitive samples such as, e.g., Li-based thin-film battery materials, carbon-based nanomaterials or zeolites for catalytic applications. Energy dispersive X-ray (EDX) analytics is required on both instruments, special acquisition modes in STEM are desirable, namely 4D-STEM in combination with the TEM camera, and a segmented detector for differential phase contrast STEM. Besides TEM sample preparation, the FIB instrument shall be employed for 3D imaging by consecutively ion-beam milling and imaging. To warrant smooth and efficient operation of these multi-user instruments, an important aspect lies on automatic or semi-automatic routines, particularly concerning materials processing by FIB.
Award criteria
- Quality — Award criteria
Awards
| Awarded to | Amount | Date |
|---|---|---|
| EN_FEI Europe B.V. | CHF 1,860,339 | — |
Official publications
- TED · 00577097-2025 · 4 September 2025
- OJS · 169/2025 · 4 September 2025
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- The contracting authority is Empa zentraler Einkauf (European Union).
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