Automatic Wafer Probers

Published

4 March 2025

Procedure

Negotiated procedure

Documents

1

Notice number

00141476-2025

Reference

87049452-2259-415f-8cec-806b33c679d9

Official source

Official source

CPV codes

• 38000000Equipo de laboratorio, óptico y de precisión (excepto gafas)

Description

In combination with measuring instruments, Auto (Frame) Probers are used for parametric testing of individual integrated circuits at wafer or sample level. The device should be suitable at least for testing micrometer-thin (a few hundred) to millimetre-thick samples or wafers of 200 mm and 300 mm diameter and for probing dies on wafer frames (for 300 mm wafers on dicing frames).

Lots (2)

Award criteria

• Price — See Tender documents
• Price — See Tender document

Official publications

• TED · 00141476-2025 · 4 March 2025
• OJS · 44/2025 · 4 March 2025

Other tenders from Imec EU Pilot line NV

• Digital tester setup · 3 August 2026
• Frame agreement for design, construction and installation of a cleanroom · 9 December 2025
• Optical Metrology & Inspection for BEOL · 3 December 2025
• Bevel Treatment Platform · 2 December 2025
• High NA EUV Scanner · 2 December 2025
• Electrical Measuring Equipment for Parametric Testing · 2 December 2025
• Frame agreement for design, construction and installation of a cleanroom · 1 December 2025
• Supply of a High Temp Resist Strip Tool · 13 November 2025
• EUV MASK CLEANER · 7 November 2025
• Frame agreement for design, construction and installation of a cleanroom · 7 November 2025

Frequently asked questions

Who is the buyer of this tender?

The contracting authority is Imec EU Pilot line NV (European Union).

How can I bid for public tenders in European Union?

Bids are submitted through the official procurement portal of European Union. El Vínculo helps you find tenders and analyse their documents; submission always happens at the official source.