11835 - Field-Emission Scanning Electron Microscope (FE-SEM)
Buyer: Technische Universiteit Delft
- Published
- 22 May 2026
- Estimated value
- €775,000
- Procedure
- neg-wo-call
- Lots
- 1
- Notice number
- 00352373-2026
- Reference
- d3f9dd89-95c2-4427-acd8-82dfe4c551f5
- Official source
- Official source
CPV codes
- 38511000Microscopios electrónicos
Description
The Department of Imaging Physics at TU Delft, Faculty of Applied Sciences, has available funding of €1,000,000.—incl. VAT through the Dutch Research Council (NWO) Knowledge and Innovation Covenant (KIC) consortium “Foundations for Electron-Beam Metrology and Inspection” for the acquisition of advanced electron microscopy instrumentation. The intended purchase is a high-end field-emission scanning electron microscope (FE-SEM) to support coherent diffractive imaging in both transmission and reflection geometries. The instrument must meet the following critical performance criteria: • High temporal and spatial coherence at accelerations voltages up to 30 keV and probe currents of 25–100 pA. • Compatibility with bulk samples exceeding 70 × 70 mm, with multiple secondary and back-scattered electron detectors in reflection mode. • Stable stage and flexible chamber design to accommodate custom detectors and electro-optical components in reflection mode. • Support for direct-electron detectors in transmission (preferably retractable), with sufficient resolution inside the bright-field disk to enable diffractive imaging algorithms. This requires a large camera length and convergence angles…
Awards
| Awarded to | Amount | Date |
|---|---|---|
| FEI Europe BV | €775,000 | — |
Frequently asked questions
- What is the estimated value of this tender?
- The estimated value published by the buyer is €775,000.
- Who is the buyer of this tender?
- The contracting authority is Technische Universiteit Delft (European Union).
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