11835 - Field-Emission Scanning Electron Microscope (FE-SEM)
Buyer: Technische Universiteit Delft
- Published
- 23 March 2026
- Procedure
- neg-wo-call
- Lots
- 1
- Notice number
- 00199198-2026
- Reference
- 88825fa7-8dc9-4e79-908f-f835d9c90b21
- Official source
- Official source
CPV codes
- 38511000Microscopios electrónicos
Description
Description The Department of Imaging Physics at TU Delft, Faculty of Applied Sciences, has available funding through the Dutch Research Council (NWO) Knowledge and Innovation Covenant (KIC) consortium “Foundations for Electron-Beam Metrology and Inspection” for the acquisition of advanced electron microscopy instrumentation. The intended purchase is a high-end field-emission scanning electron microscope (FE-SEM) to support coherent diffractive imaging in both transmission and reflection geometries. The instrument must meet the following critical performance criteria: • High temporal and spatial coherence at acceleration voltages of 5–30 keV and probe currents of 25–100 pA. • Compatibility with bulk samples exceeding 70 × 70 mm, with multiple secondary and back-scattered electron detectors in reflection mode. • Stable stage and flexible chamber design to accommodate custom detectors and electro-optical components in reflection mode. • Support for direct-electron detectors in transmission (preferably retractable), with sufficient resolution inside the bright-field disk to enable diffractive imaging algorithms. This requires a large camera length and convergence angles exceeding 10 m…
Awards
| Awarded to | Amount | Date |
|---|---|---|
| FEI Europe B.V. | — | — |
Frequently asked questions
- Who is the buyer of this tender?
- The contracting authority is Technische Universiteit Delft (European Union).
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